華旭矽材股份有限公司HUAHSU
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2023 SEMICON Taiwan
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2018SEMICON
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Si Reclaim Wafer/ test wafer
SiC wafer
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Silicon Reclaim/Test Wafer Process Introduction
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Quality System
Automotive Quality Management System
Quality Monitoring - Metal Impurities
Quality Monitoring - Wafer Quality Control
Quality Management
Quality Monitoring - Wafer Quality Control
Quality Monitoring - Wafer Quality Control
•Silicon wafer chip surface particle quantity analyzer - Measurement photos and equipment diagrams.
•Silicon Carbide Wafer Surface Inspection System - Measurement photos and equipment diagrams.
•Wafer Flatness Measurement Instrument - Measurement photos and equipment diagrams.
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